SSI Applications

Dive Deeper into SSI Case Studies

Explore real-world case studies showing how Subaperture Stitching Interferometry (SSI) supports complex optical measurement. These examples showcase detailed surface data, application-driven solutions, and reliable measurement performance across a range of optical components.

  • High-Precision Sphere Measurements with SSI™

    Case Study Summary Focusing on the repeatability of SSI-based measurements, this study confirms the system’s ability to provide consistent results across multiple scans of the same concave spherical optic. Achieving a mean RMS value of 5.60 nm with minimal variance (standard deviation of 0.007 nm), the findings reinforce SSI’s utility in production environments where consistent

  • High-Precision Asphere Measurements Using SSI™

    Case Study Summary This case study showcases SSI’s ability to perform sub-nanometer precision measurements on high-precision aspheres. By analyzing two sets of 10 stitched measurements with slightly different scan lattices, QED demonstrates pixel-by-pixel subtraction techniques that yield RMS differences around 0.1 nm. This level of agreement confirms the system’s capability to reliably characterize complex optical

  • Cross-Test Results with SSI™ for High-Precision Sphere Measurements

    Case Study Summary This case study explores the accuracy and repeatability of QED Technologies’ Subaperture Stitching Interferometry (SSI®) in measuring high-precision spherical optics. Using a concave test sphere with a 25 mm radius and 36 mm aperture, the study highlights SSI’s ability to consistently measure surface form to a repeatability of just 0.007 nm RMS,

  • Applications of SSI™: High Precision Sphere Measurements

    Case Study Summary This study highlights the exceptional measurement repeatability and accuracy of QED’s Subaperture Stitching Interferometry (SSI) technology. Through rigorous testing on a small, fast reference sphere, the SSI system demonstrated sub-nanometer repeatability with a mean RMS value of 5.60 nm and a variation range as low as 0.025 nm. Cross-validation between different measurement

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