ASI-480
Aspheric Stitching Interferometer with QIS™
QED Technologies® Aspheric Stitching Interferometer (ASI™) expands capabilities in optics metrology with more accurate measurements of aspheres and freeforms, without the need for costly null-optics. It delivers high-quality data with higher resolution, reduced retrace error, and the ability to handle high fringe densities and shorter radii by leveraging stitching with QED’s Interferometer for Stitching (QIS).
A Powerful Step Up in Aperture Size and Measurement Capability
The ASI-480 is designed to measure larger diameter optics without sacrificing accuracy or ease of use. With increased lateral resolution and a broader field of view than the ASI-300, this model bridges the gap between compact systems and full-scale metrology platforms—perfect for production environments with expanding aperture demands.
QIS: Interferometer for Stitching
QED Technologies’ QIS is the first interferometer specifically designed for stitching. It incorporates hardware and software developed to enhance the performance of QED Technologies’ metrology products. The proprietary QIS coherent imaging system allows users to obtain measurements with higher fringe densities and greater contrast while reducing common errors such as retrace and magnification errors.
The Stitching Advantage
The QIS improves accuracy by automatically calibrating systematic instrument errors.
A larger field of view enables you to see more of the surface.
Higher lateral frequency content provides a more detailed picture of the surface.
Stitching enables asphere and freeform measurement capability without null optics.
Customizable Platform
The ASI offers multiple configurations to meet technician needs and expand the range of measurable optics. The QED Technologies’ ASI enables the measurement of a wide range of high departure optics with diameters from 300 mm to 550 mm due to the stitching capabilities of the QIS. With advanced software, such as MES Connect for ASI, you can monitor the machine status in real time through OPC UA. The revamped scratchpad interface provides a more seamless user experience.
Explore the Full Metrology Portfolio
Explore the complete portfolio of optical metrology systems designed to deliver fast, accurate, and non-contact measurement across a full range of surface shapes, sizes, and materials.