QIS™ Interferometer
Engineered for Precision Stitching
QED Interferometer (QIS) is the first interferometer purpose-built for stitching, enabling high-accuracy measurement of aspheres and freeforms. With enhanced fringe density, contrast, and error correction, QIS delivers superior data for advanced optical manufacturing.
QED Interferometer for Stitching
QIS is the interferometer designed, engineered and built by QED Technologies®. It is optimized for stitching and gives customers the ability to measure more parts, with improved accuracy, speed and ease of use.
QED Technologies’ QIS is the first interferometer specifically designed for stitching. It incorporates hardware and software developed to enhance the performance of QED’s metrology products. The proprietary QIS coherent imaging system allows users to obtain measurements with higher fringe densities and greater contrast while reducing common errors such as retrace and magnification errors.
Expanded Measurement Capability
Greater focus travel provided by QIS allows for the measurement of parts with shorter radii than possible with a general purpose interferometer. QIS was also designed using the same software platform, QED.NET, as QED Technologies Q-flex® MRF® systems, which enables seamless communications between systems. The new 1920 x 1920 pixel, high-resolution camera allows for improved spot measurement capability. This means that you can more accurately characterize the MRF removal function, enabling you to make better manufacturing process decisions and achieve convergence faster and with more accuracy.
The Stitching Advantage
The QIS improves accuracy by automatically calibrating systematic instrument errors.
A larger field of view enables you to see more of the surface.
Higher lateral frequency content provides a more detailed picture of the surface.
Stitching enables asphere and freeform measurement capability without null optics.
The “Q” Advantage
QED Technologies’ ASI™ metrology system is powered by QIS, the QED Technologies interferometer for stitching that is completely designed, engineered and built by QED Technologies. Combined with robust QED.NET software, you have the advantage of a metrology powerhouse that is optimized for stitching and enables better qualification of MRF removal. QED Technologies innovation allows for expanded capabilities and added versatility to your metrology systems.
Explore the Full Metrology Portfolio
Explore the complete portfolio of optical metrology systems designed to deliver fast, accurate, and non-contact measurement across a full range of surface shapes, sizes, and materials.