Metrology
QED Technologies® metrology systems are purpose-built to characterize even the most complex optical surfaces with speed, accuracy, and confidence. From high-resolution interferometry to non-contact, full-surface form measurement, our tools provide the data you need to ensure your optics meet the highest performance standards. Discover metrology solutions that integrate seamlessly into your process and elevate your results.
All Metrology Products
Measuring with SSI™ (Subaperture Stitching Interferometry)
SSI provides accurate metrology for small and mid-sized optics using advanced subaperture stitching techniques. It’s a critical tool for qualifying surface accuracy at early or final stages of fabrication.
Measuring with NMF™ (Nanomefos)
NMF systems provide high-speed, high-accuracy measurement of form and surface errors for freeform and large-diameter optics. Ideal for aspheric and freeform shapes where other systems fall short.