High-Precision Sphere Measurements with SSI™

Case Study Summary

Focusing on the repeatability of SSI-based measurements, this study confirms the system’s ability to provide consistent results across multiple scans of the same concave spherical optic. Achieving a mean RMS value of 5.60 nm with minimal variance (standard deviation of 0.007 nm), the findings reinforce SSI’s utility in production environments where consistent measurement precision is critical.