SSI™ Metrology
Full-Aperture Accuracy for Complex Optics
Subaperture Stitching Interferometry (SSI) metrology from QED Technologies captures high-resolution surface data across large and difficult-to-measure optics delivering the precision, flexibility, and process insight that modern manufacturing demands.
Measuring with SSI Subaperture Stitching Interferometry
SSI is an advanced optical metrology method developed by QED Technologies that provides highly accurate surface measurements for large, strongly curved, and complex optics. SSI enables manufacturers to generate full-aperture surface maps by merging multiple smaller subaperture measurements into a single, high-resolution dataset, improving both process control and optical performance.
Benefits of SSI Metrology for Precision Optics Measurement
SSI combines the detail of interferometric measurement with the flexibility to measure optics that are difficult or impossible to test using conventional interferometry. Key benefits include:
- High accuracy and repeatability across the surface of complex optics
- Full-aperture measurements from stitched subaperture data
- Elimination of custom null optics in many cases
- Enhanced process feedback for manufacturing applications
- Faster iteration and improved alignment to specification
SSI helps manufacturers reduce risk, improve yield, and gain deeper insight into surface form error.
Optical Surfaces and Geometries Supported by SSI
SSI metrology supports a broad range of surface types and optical shapes, including:
- Flats and spherical optics
- Aspheric surfaces
- Freeform geometries
- Large apertures
- Strongly curved optics
The technique is effective across many materials, enabling surface measurement on substrates such as glass, crystals, ceramics, and other precision materials commonly used in optics manufacturing.
Integration with Manufacturing Workflows
SSI metrology is designed to support manufacturing processes by providing reliable, actionable measurement data that enables:
- Closed-loop feedback between measurement and polishing
- Faster convergence to specification
- Improved process control and reduced rework
- Overlap between measBetter traceability and quality assurance
By integrating SSI into the production environment, manufacturers gain confidence in measured surface data and make more informed decisions during polishing and finishing operations.
SSI Metrology Systems from QED Technologies
QED Technologies offers SSI metrology systems that are engineered for precision, flexibility, and ease of use on the shop floor. Our systems feature:
- Interferometric subaperture measurement capability
- High-resolution data acquisition
- Automated measurement routines
- Software for data stitching, analysis, and reporting
These systems are supported by intuitive interfaces and advanced software tools that deliver reliable results and efficient workflows.
QED Technologies SSI Systems
QED Technologies offers a range of ASI systems engineered to deliver accurate, full-aperture surface measurements without the need for custom null optics. These stitching interferometers combine advanced software, high-resolution data capture, and flexible configurations to support complex aspheres and freeforms with precision and efficiency.
Learn More About SSI Metrology
To explore how SSI metrology can enhance your measurement capability, improve surface quality, support process control, visit our product pages, access technical resources, or contact a QED Technologies specialist for more information.